KOROTCHENKO, L. A.; RADZIVILOV, G. D.; HULII, V. S.; YAKOVENKO, S. M. Analysis of the application of the method of forecasting the reliability of radioelectronic means at the test noise level. Military Technical Collection, [S. l.], n. 21, p. 67–71, 2019. DOI: 10.33577/2312-4458.21.2019.67-71. Disponível em: http://vtz.asv.gov.ua/article/view/182460. Acesso em: 9 mar. 2022.